User Contributed MET/CAL Procedure ============================================================================= INSTRUMENT: Hewlett Packard Model 3455A Digital Voltmeter(I) DATE: 31-Aug-92 AUTHOR: User Contributed REVISION: 1 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 64 NUMBER OF LINES: 342 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R Q P A W 1.002 DISP 1. Connect the HP3455A to the 5700A output terminals 1.002 DISP in a 4 wire configuration on the UUT to 2 wire on 1.002 DISP the 5700A. 1.002 DISP 2. Allow DVM to warm up a minimum of 1 hour 1.002 DISP 3. Make shure the guard in set to HI (Out position) 1.002 DISP 4. Connect the leads a minimum of tem minutes before 1.002 DISP verification begins to minimize thermal offsets. 1.002 DISP 5. Press F2 if you wish to see the results in progress 1.003 HEAD [7][27][91]1m{DIRECT VOLTAGE TESTS HIGH RES OFF} 1.004 IEEE F1R2H0M3A1D0 1.005 5700 1V S 2W 1.006 IEEE T1[D1000][I] 1.007 MEME 1.008 MEMC 1 V 0.007% 2.001 5700 -1V S 2W 2.002 IEEE T1[D1000][I] 2.003 MEME 2.004 MEMC -1 V 0.007% 3.001 IEEE R3 3.002 5700 10V S 2W 3.003 IEEE T1[D1000][I] 3.004 MEME 3.005 MEMC 10 V 0.006% 4.001 5700 -10V S 2W 4.002 IEEE T1[D1000][I] 4.003 MEME 4.004 MEMC -10 V 0.006% 5.001 IEEE R5 5.002 5700 1000V S 2W 5.003 IEEE T1[D1000][I] 5.004 MEME 5.005 MEMC 1000 V 0.008% 6.001 5700 500V S 2W 6.002 IEEE T1[D1000][I] 6.003 MEME 6.004 MEMC 500 V 0.008% 7.001 5700 -500V S 2W 7.002 IEEE T1[D1000][I] 7.003 MEME 7.004 MEMC -500 V 0.008% 8.001 IEEE R4 8.002 5700 100V S 2W 8.003 IEEE T1[D1000][I] 8.004 MEME 8.005 MEMC 100 V 0.008% 9.001 5700 -100V S 2W 9.002 IEEE T1[D1000][I] 9.003 MEME 9.004 MEMC -100 V 0.008% 10.001 IEEE R1 10.002 5700 0.1V S 2W 10.003 IEEE T1[D1000][I] 10.004 MEME 10.005 MEMC 0.1 V 0.011% 11.001 5700 -0.1V S 2W 11.002 IEEE T1[D1000][I] 11.003 MEME 11.004 MEMC -0.1 V 0.011% 12.001 HEAD [7][27][91]1m{DC VOLTAGE TESTS HIGH RES ON} 12.002 IEEE H1R2 12.003 5700 1V S 2W 12.004 IEEE T1[D1000][I] 12.005 MEME 12.006 MEMC 1 V 0.0064% 13.001 5700 -1V S 2W 13.002 IEEE T1[D1000][I] 13.003 MEME 13.004 MEMC -1 V 0.0064% 14.001 IEEE R3 14.002 5700 10V S 2W 14.003 IEEE T1[D1000][I] 14.004 MEME 14.005 MEMC 10 V 0.0053% 15.001 5700 -10V S 2W 15.002 IEEE T1[D1000][I] 15.003 MEME 15.004 MEMC -10 V 0.0053% 16.001 IEEE R5 16.002 5700 1000V S 2W 16.003 IEEE T1[D1000][I] 16.004 MEME 16.005 MEMC 1000 V 0.0073% 17.001 5700 500V S 2W 17.002 IEEE T1[D1000][I] 17.003 MEME 17.004 MEMC 500 V 0.0076% 18.001 5700 -500V S 2W 18.002 IEEE T1[D1000][I] 18.003 MEME 18.004 MEMC -500 V 0.0076% 19.001 5700 100V S 2W 19.002 IEEE T1[D1000][I] 19.003 MEME 19.004 MEMC 100 V 0.01% 20.001 5700 -100V S 2W 20.002 IEEE T1[D1000][I] 20.003 MEME 20.004 MEMC -100 V 0.01% 21.001 IEEE R4 21.002 5700 100V S 2W 21.003 IEEE T1[D1000][I] 21.004 MEME 21.005 MEMC 100 V 0.0073% 22.001 5700 -100V S 2W 22.002 IEEE T1[D1000][I] 22.003 MEME 22.004 MEMC -100 V 0.0073% 23.001 5700 50V S 2W 23.002 IEEE T1[D1000][I] 23.003 MEME 23.004 MEMC 50 V 0.0076% 24.001 5700 -50V S 2W 24.002 IEEE T1[D1000][I] 24.003 MEME 24.004 MEMC -50 V 0.0076% 25.001 5700 10V S 2W 25.002 IEEE T1[D1000][I] 25.003 MEME 25.004 MEMC 10 V 0.01% 26.001 5700 -10V S 2W 26.002 IEEE T1[D1000][I] 26.003 MEME 26.004 MEMC -10 V 0.01% 27.001 IEEE R2 27.002 5700 0.5V S 2W 27.003 IEEE T1[D1000][I] 27.004 MEME 27.005 MEMC 0.5 V 0.0068% 28.001 5700 -0.5V S 2W 28.002 IEEE T1[D1000][I] 28.003 MEME 28.004 MEMC -0.5 V 0.0068% 29.001 5700 0.1V S 2W 29.002 IEEE T1[D1000][I] 29.003 MEME 29.004 MEMC 0.1 V 0.01% 30.001 5700 -0.1V S 2W 30.002 IEEE T1[D1000][I] 30.003 MEME 30.004 MEMC -0.1 V 0.01% 31.001 CALL HP3455A ALTERNATING VOLTAGE TESTS SUB 31.002 HEAD [7][27][91]1m{TWO-WIRE RES ACC TEST HIRES OFF} 31.003 IEEE F4H0R1 31.004 5700 100Z S RW 31.005 IEEE T1[D1000][I] 31.006 MEME 31.007 MEMC 0.1 Z 0.41% 32.001 IEEE R2 32.002 5700 1000Z S RW 32.003 IEEE T1[D1000][I] 32.004 MEME 32.005 MEMC 1 Z 0.046% 33.001 IEEE R3 33.002 5700 10000Z S RW 33.003 IEEE T1[D5000][I] 33.004 MEME 33.005 MEMC 10 Z 0.013% 34.001 IEEE R4 34.002 5700 100000Z S 2W 34.003 IEEE T1[D5000][I] 34.004 MEME 34.005 MEMC 100 Z 0.006% 35.001 IEEE R5 35.002 5700 1000000Z S 2W 35.003 IEEE T1[D5000][I] 35.004 MEME 35.005 MEMC 1000 Z 0.019% 36.001 IEEE R6 36.002 5700 10000000Z S 2W 36.003 IEEE T1[D5000][I] 36.004 MEME 36.005 MEMC 10000 Z 0.105% 37.001 HEAD [7][27][91]1m{TWO-WIRE RES ACC TEST HIRES ON} 37.002 IEEE F4H1R1 37.003 IEEE R2 37.004 5700 1000Z S RW 37.005 IEEE T1[D1000][I] 37.006 MEME 37.007 MEMC 1 Z 0.044% 38.001 IEEE R3 38.002 5700 10000Z S RW 38.003 IEEE T1[D5000][I] 38.004 MEME 38.005 MEMC 10 Z 0.0105% 39.001 IEEE R4 39.002 5700 100000Z S 2W 39.003 IEEE T1[D5000][I] 39.004 MEME 39.005 MEMC 100 Z 0.0055% 40.001 IEEE R5 40.002 5700 1000000Z S 2W 40.003 IEEE T1[D5000][I] 40.004 MEME 40.005 MEMC 1000 Z 0.014% 41.001 IEEE R6 41.002 5700 10000000Z S 2W 41.003 IEEE T1[D5000][I] 41.004 MEME 41.005 MEMC 10000 Z 0.1005% 42.001 HEAD [7][27][91]1m{FOUR-WIRE RES ACC TEST HIRES OFF} 42.002 IEEE F5H0R1 42.003 5700 100Z S RW 42.004 IEEE T1[D1000][I] 42.005 MEME 42.006 MEMC 0.1 Z 0.0175% 43.001 IEEE R2 43.002 5700 1000Z S RW 43.003 IEEE T1[D1000][I] 43.004 MEME 43.005 MEMC 1 Z 0.044% 44.001 IEEE R3 44.002 5700 10000Z S RW 44.003 IEEE T1[D5000][I] 44.004 MEME 44.005 MEMC 10 Z 0.0105% 45.001 IEEE R4 45.002 5700 100000Z S 2W 45.003 IEEE T1[D5000][I] 45.004 MEME 45.005 MEMC 100 Z 0.0055% 46.001 IEEE R5 46.002 5700 1000000Z S 2W 46.003 IEEE T1[D5000][I] 46.004 MEME 46.005 MEMC 1000 Z 0.014% 47.001 IEEE R6 47.002 5700 10000000Z S 2W 47.003 IEEE T1[D5000][I] 47.004 MEME 47.005 MEMC 10000 Z 0.1005% 48.001 HEAD [7][27][91]1m{HIGH FREQ RESP TESTS ACV} 48.002 IEEE F2R2 48.003 5700 1V 10KH S 2W 48.004 IEEE T1[D1000][I] 48.005 MEME >1 48.006 5700 1V 110KH S 2W 48.007 IEEE T1[D1000][I] 48.008 MEME 48.009 MEME <1 48.010 MEMC V 2.25% 110kH 49.001 5700 1V 250KH S 2W 49.002 IEEE T1[D1000][I] 49.003 MEME 49.004 MEME <1 49.005 MEMC V 2.25% 250kH 50.001 5700 1V 500KH S 2W 50.002 IEEE T1[D1000][I] 50.003 MEME 50.004 MEME <1 50.005 MEMC V 5.5% 500kH 51.001 5700 1V 1MH S 2W 51.002 IEEE T1[D1000][I] 51.003 MEME 51.004 MEME <1 51.005 MEMC V 8% 1MH 52.001 IEEE F2R3 52.002 5700 6V 10KH S 2W 52.003 IEEE T1[D1000][I] 52.004 MEME >1 52.005 5700 6V 110KH S 2W 52.006 IEEE T1[D1000][I] 52.007 MEME 52.008 MEME <1 52.009 MEMC V 2.42% 110kH 53.001 5700 6V 250KH S 2W 53.002 IEEE T1[D1000][I] 53.003 MEME 53.004 MEME <1 53.005 MEMC V 2.42% 250kH 54.001 5700 6V 500KH S 2W 54.002 IEEE T1[D1000][I] 54.003 MEME 54.004 MEME <1 54.005 MEMC V 5.84% 500kH 55.001 5700 6V 1MH S 2W 55.002 IEEE T1[D1000][I] 55.003 MEME 55.004 MEME <1 55.005 MEMC V 9.33% 1MH 56.001 HEAD [7][27][91]1m{HIGH FREQ RESP TESTS FAST ACV} 56.002 IEEE F3R2 56.003 5700 1V 10KH S 2W 56.004 IEEE T1[D1000][I] 56.005 MEME >1 56.006 5700 1V 110KH S 2W 56.007 IEEE T1[D1000][I] 56.008 MEME 56.009 MEME <1 56.010 MEMC V 2.25% 110kH 57.001 5700 1V 250KH S 2W 57.002 IEEE T1[D1000][I] 57.003 MEME 57.004 MEME <1 57.005 MEMC V 2.25% 250kH 58.001 5700 1V 500KH S 2W 58.002 IEEE T1[D1000][I] 58.003 MEME 58.004 MEME <1 58.005 MEMC V 5.5% 500kH 59.001 5700 1V 1MH S 2W 59.002 IEEE T1[D1000][I] 59.003 MEME 59.004 MEME <1 59.005 MEMC V 8% 1MH 60.001 IEEE F2R3 60.002 5700 6V 10KH S 2W 60.003 IEEE T1[D1000][I] 60.004 MEME >1 60.005 5700 6V 110KH S 2W 60.006 IEEE T1[D1000][I] 60.007 MEME 60.008 MEME <1 60.009 MEMC V 2.42% 110kH 61.001 5700 6V 250KH S 2W 61.002 IEEE T1[D1000][I] 61.003 MEME 61.004 MEME <1 61.005 MEMC V 2.42% 250kH 62.001 5700 6V 500KH S 2W 62.002 IEEE T1[D1000][I] 62.003 MEME 62.004 MEME <1 62.005 MEMC V 5.84% 500kH 63.001 5700 6V 1MH S 2W 63.002 IEEE T1[D1000][I] 63.003 MEME 63.004 MEME <1 63.005 MEMC V 9.33% 1MH 64.001 END